J Vanhellemont: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Very large trees in a lowland old-growth beech ( Fagus sylvatica L.) forest: Density, size, growth and spatial patterns in comparison to reference sites in Europe

Vandekerkhove, Kris, Vanhellemont, Margot, Vrška, Tomáš, Meyer, Peter, Tabaku, Vath, Thomaes, Arno, Leyman, Anja, De Keersmaeker, Luc, Verheyen, Kris

Journal:

Forest Ecology and Management

Year:

2018

Language:

english

File:

PDF, 1.33 MB

english, 2018

2

Contact sponge method: Performance of a promising tool for measuring the initial water absorption

Delphine Vandevoorde, Marisa Pamplona, Olivier Schalm, Yves Vanhellemont, Veerle Cnudde, Eddy Verhaeven

Journal:

Journal of Cultural Heritage

Year:

2009

Language:

english

File:

PDF, 343 KB

english, 2009

3

Numerical aspects of the implementation of effective-medium approximation models in spectroscopic ellipsometry regression software

Ph.J. Rouseel, J. Vanhellemont, H.E. Maes

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 347 KB

english, 1993

4

Carrier lifetime dependence on doping, metal implants and excitation density in Ge and Si

E. Gaubas, J. Vanhellemont, E. Simoen, I. Romandic, W. Geens, P. Clauws

Journal:

Physica B: Condensed Matter

Year:

2007

Language:

english

File:

PDF, 229 KB

english, 2007

5

Calorimetric single particle detection in high magnetic fields at low temperatures

De Moor, P., Camps, J., Schuurmans, P., Severijns, N., Vanderpoorten, W., Van Geert, A., Vanhellemont, Y., Vanneste, L., Wouters, J., Coron, N., Jegoudez, G., Leblanc, J.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 349 KB

english, 1996

6

Plant and soil microbe responses to light, warming and nitrogen addition in a temperate forest

Ma, Shiyu, Verheyen, Kris, Props, Ruben, Wasof, Safaa, Vanhellemont, Margot, Boeckx, Pascal, Boon, Nico, De Frenne, Pieter

Journal:

Functional Ecology

Year:

2018

Language:

english

File:

PDF, 869 KB

english, 2018

7

Correction to: Phytomining to re-establish phosphorus-poor soil conditions for nature restoration on former agricultural land

Schelfhout, Stephanie, De Schrijver, An, Vanhellemont, Margot, Vangansbeke, Pieter, Wasof, Safaa, Perring, Michael P., Haesaert, Geert, Verheyen, Kris, Mertens, Jan

Journal:

Year:

2019

Language:

english

File:

PDF, 116 KB

english, 2019

8

Environmental Reporting by the EU Member States and the Commission â Current Practices, Legislative Action and a Way Forward

Vanhellemont, Anna

Journal:

Journal for European Environmental & Planning Law

Year:

2020

File:

PDF, 367 KB

2020

9

1 MeV electron irradiation induced degradation of boron-doped strained Si1−xGex layers

J. Vanhellemont, M.-A. Trauwaert, J. Poortmans, M. Caymax, P. Clauws

Journal:

Thin Solid Films

Year:

1992

Language:

english

File:

PDF, 644 KB

english, 1992

10

Study of the non-linear I-V characteristics of thermistors in the variable range hopping conduction at low temperatures and in high magnetic fields

P De Moor, J Camps, P Schuurmans, N Severijns, A Van Geert, Y Vanhellemont, L Vanneste

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

1996

Language:

english

File:

PDF, 142 KB

english, 1996

11

On the assessment of local stress distributions in integrated circuits

J. Vanhellemont, I. De Wolf, K.G.F. Janssens, S. Frabboni, R. Balboni, A. Armigliato

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 573 KB

english, 1993

12

Dependence of gate oxide integrity on grown-in defect density in Czochralski grown silicon

U. Lambert, A. Huber, J. Grabmeier, G. Obermeier, J. Vanhellemont, R. Wahlich, G. Kissinger

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 293 KB

english, 1999

13

Denuded zone formation by conventional and rapid thermal anneals

G Kissinger, J Vanhellemont, G Obermeier, J Esfandyari

Journal:

Materials Science and Engineering: B

Year:

2000

Language:

english

File:

PDF, 444 KB

english, 2000

14

Lifetime and leakage current considerations in metal-doped germanium

E. Simoen, C. Claeys, S. Sioncke, J. Van Steenbergen, M. Meuris, S. Forment, J. Vanhellemont, P. Clauws, A. Theuwis

Journal:

Journal of Materials Science: Materials in Electronics

Year:

2007

Language:

english

File:

PDF, 248 KB

english, 2007

15

Gas chromatography in nuclear fuel rod fabrication

F. Eeckhout, C. Massa, G. Vanhellemont

Journal:

Journal of Nuclear Materials

Year:

1982

Language:

english

File:

PDF, 786 KB

english, 1982

16

Spectroscopic ellipsometry of strained Si1-x Gex layers

M. Líbezný, J. Poortmans, M. Caymax, A. Van Ammel, J. Kuběna, V. Holý, J. Vanhellemont

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 351 KB

english, 1993

17

Characterization of different conversion coatings on aluminium with spectroscopic ellipsometry

J. De Laet, J. Vanhellemont, H. Terryn, J. Vereecken

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 448 KB

english, 1993

18

On the relation between low-temperature epitaxial growth conditions and the surface morphology of epitaxial Si and Si1−xGex layers, grown in an ultrahigh vacuum, very low pressure chemical vapour deposition reactor

M. Caymax, J. Poortmans, A. Van Ammel, J. Vanhellemont, M. Libezny, J. Nijs, R. Mertens

Journal:

Thin Solid Films

Year:

1994

Language:

english

File:

PDF, 469 KB

english, 1994

19

Non-destructive thickness determination of thin cobalt and cobalt disilicide layers on silicon substrates

E Roca, J Vanhellemont, R.J Schreutelkamp, J Vermeiren

Journal:

Thin Solid Films

Year:

1994

Language:

english

File:

PDF, 419 KB

english, 1994

20

Brother Silicon, Sister Germanium

Vanhellemont, J., Simoen, E.

Journal:

Journal of The Electrochemical Society

Year:

2007

Language:

english

File:

PDF, 1.08 MB

english, 2007

21

Erratum: ââA theoretical study on the critical radius of precipitates and its application to silicon oxide in siliconââ [J. Appl. Phys. 62, 3960 (1987)]

Vanhellemont, Jan, Claeys, Cor

Journal:

Journal of Applied Physics

Year:

1992

Language:

english

File:

PDF, 314 KB

english, 1992

22

A simple technique for the separation of bulk and surface recombination parameters in silicon

Gaubas, E., Vanhellemont, J.

Journal:

Journal of Applied Physics

Year:

1996

Language:

english

File:

PDF, 363 KB

english, 1996

23

Observation of critical gate oxide thickness for substrate-defect related oxide failure

T. Bearda, M. Houssa, P. W. Mertens, J. Vanhellemont, M. Heyns

Year:

1999

Language:

english

File:

PDF, 304 KB

english, 1999

24

Comparative Study of Carrier Lifetime Dependence on Dopant Concentration in Silicon and Germanium

Gaubas, E., Vanhellemont, J.

Journal:

Journal of The Electrochemical Society

Year:

2007

Language:

english

File:

PDF, 583 KB

english, 2007

25

On the Role of Point Defects in Gettering Processes

Vanhellemont, Jan, Claeys, C.

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 392 KB

1989

26

The Role of Point Defects in the Nucleation of Film Edge Induced Dislocations in Silicon

Vanhellemont, Jan, Claeys, C., Van Landuyt, J.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 425 KB

1986

27

Defects in AS-Grown Silicon and their Evolution During Heat Treatments

Vanhellemont, Jan, Dornberger, E., Esfandyari, J., Kissinger, G., Trauwaert, M.-A., Bender, H., Gräf, D., Lambert, U., von Ammon, Wilfried

Journal:

Materials Science Forum

Year:

1997

File:

PDF, 518 KB

1997

28

Conditions for the Formation of Ring-Like Distributed Stacking Faults in CZ-Si Wafers

Kissinger, Gudrun, Vanhellemont, Jan, Lambert, Ulrich, Gräf, Dieter, Grabolla, Thomas, Richter, Hans

Journal:

Japanese Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 90 KB

english, 1998

29

Retrieval of vertical profiles of atmospheric refraction angles by inversion of optical dilution measurements

Fussen, D., Tétard, C., Dekemper, E., Pieroux, D., Mateshvili, N., Vanhellemont, F., Franssens, G., Demoulin, P.

Journal:

Atmospheric Measurement Techniques Discussions

Year:

2015

Language:

english

File:

PDF, 688 KB

english, 2015

30

Contributions of a global network of tree diversity experiments to sustainable forest plantations

Verheyen, Kris, Vanhellemont, Margot, Auge, Harald, Baeten, Lander, Baraloto, Christopher, Barsoum, Nadia, Bilodeau-Gauthier, Simon, Bruelheide, Helge, Castagneyrol, Bastien, Godbold, Douglas, Haase,

Journal:

AMBIO: A Journal of the Human Environment

Year:

2016

Language:

english

File:

PDF, 1.34 MB

english, 2016

31

The Hakoniwa method, an approach to predict material properties based on statistical thermodynamics and ab initio calculations

Kamiyama, Eiji, Matsutani, Ryo, Suwa, Ryo, Vanhellemont, Jan, Sueoka, Koji

Journal:

Materials Science in Semiconductor Processing

Year:

2016

Language:

english

File:

PDF, 408 KB

english, 2016

32

Transmission Electron Diffraction Techniques for NM Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.21 MB

english, 1995

33

Transmission Electron Diffraction Techniques for Nm Scale Strain Measurement in Semiconductors

Vanhellemont, J., Janssens, K. G. F., Frabboni, S., Smeys, P., Balboni, R., Armigliato, A.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 3.32 MB

english, 1995

34

Stress and doping impact on intrinsic point defect behavior in growing single crystal silicon (Phys. Status Solidi B 11/2014)

Sueoka, Koji, Kamiyama, Eiji, Vanhellemont, Jan, Nakamura, Kozo

Journal:

physica status solidi (b)

Year:

2014

File:

PDF, 21.81 MB

2014

35

Impacts of thermal stress and doping on intrinsic point defect properties and clustering during single crystal silicon and germanium growth from a melt

Vanhellemont, Jan, Kamiyama, Eiji, Nakamura, Kozo, Śpiewak, Piotr, Sueoka, Koji

Journal:

Journal of Crystal Growth

Year:

2016

Language:

english

File:

PDF, 1.01 MB

english, 2016

36

Potential of High Spatial and Temporal Ocean Color Satellite Data to Study the Dynamics of Suspended Particles in a Micro-Tidal River Plume

Ody, Anouck, Doxaran, David, Vanhellemont, Quinten, Nechad, Bouchra, Novoa, Stefani, Many, Gaël, Bourrin, François, Verney, Romaric, Pairaud, Ivane, Gentili, Bernard

Journal:

Year:

2016

Language:

english

File:

PDF, 7.83 MB

english, 2016

37

Harmonisation in Environmental and Energy Law

Vanheusden, Bernard, Vanhellemont, Anna

Journal:

Environmental Policy and Law

Year:

2019

Language:

english

File:

PDF, 1.05 MB

english, 2019

38

Extending Landsat 8: Retrieval of an Orange contra-Band for Inland Water Quality Applications

Castagna, Alexandre, Simis, Stefan, Dierssen, Heidi, Vanhellemont, Quinten, Sabbe, Koen, Vyverman, Wim

Journal:

Year:

2020

File:

PDF, 3.49 MB

2020

39

Combined land surface emissivity and temperature estimation from Landsat 8 OLI and TIRS

Vanhellemont, Quinten

Journal:

ISPRS Journal of Photogrammetry and Remote Sensing

Year:

2020

File:

PDF, 8.93 MB

2020

40

Extended Defects Formation in Si Crystals by Clustering of Intrinsic Point Defects Studied by in-situ Electron Irradiation in an HREM

L. Fedina, A. Gutakovskii, A. Aseev, J. Van Landuyt, J. Vanhellemont

Journal:

physica status solidi (a)

Year:

1999

Language:

english

File:

PDF, 515 KB

english, 1999

41

In-Situ HVEM study of dopant dependent {113}-defect generation in silicon during 1-MeV electron irradiation

Albert Romano-Rodriguez, Jan Vanhellemont

Journal:

Microscopy Research and Technique

Year:

1993

Language:

english

File:

PDF, 226 KB

english, 1993

42

A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON

Koenraad G. F. Janssens, Jan Vanhellemont, Omer van der Biest

Journal:

Microscopy Research and Technique

Year:

1993

Language:

english

File:

PDF, 239 KB

english, 1993

43

Recent progress in the understanding of crystallographic defects in silicon

C. Claeys, J. Vanhellemont

Journal:

Journal of Crystal Growth

Year:

1993

Language:

english

File:

PDF, 2.83 MB

english, 1993

44

Observation of stacking faults and prismatic punching systems in silicon by light scattering tomography

G. Kissinger, J. Vanhellemont, C. Claeys, H. Richter

Journal:

Journal of Crystal Growth

Year:

1996

Language:

english

File:

PDF, 472 KB

english, 1996

45

On the relationship between the bulk recombination lifetime and the excess 1f noise in silicon p-n junction diodes

E Simoen, J Vanhellemont, C Claeys

Journal:

Solid State Communications

Year:

1996

Language:

english

File:

PDF, 320 KB

english, 1996

46

Spectroscopic ellipsometry studies of SIMOX structures and correlation with cross-section TEM

J Vanhellemont, HE Maes, A De Veirman

Journal:

Year:

1991

Language:

english

File:

PDF, 1.58 MB

english, 1991

47

Defects in high-dose oxygen implanted silicon: a TEM study

A De Veirman, J Van Landuyt, J Vanhellemont, H E Maes, K Yallup

Journal:

Year:

1991

Language:

english

File:

PDF, 1.23 MB

english, 1991

48

Formation of buried CoSi2 layers by ion implantation and their stability at high temperatures

M.F. Wu, A. Vantomme, H. Pattyn, G. Langouche, K. Maex, J. Vanhellemont

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 436 KB

english, 1989

49

Formation of ultra-thin buried CoSi2 layers by ion implantation in (100) Si

Karen Maex, Jan Vanhellemont, Sture Petersson, Anne Lauwers

Journal:

Applied Surface Science

Year:

1991

Language:

english

File:

PDF, 666 KB

english, 1991

50

Round robin investigation of silicon oxide on silicon reference materials for ellipsometry

J. Vanhellemont, H.E. Maes, M. Schaekers, A. Armigliato, H. Cerva, A. Cullis, J. de Sande, H. Dinges, J. Hallais, V. Nayar, C. Pickering, J.-L. Stehlé, J. Van Landuyt, C. Walker, H. Werner, P. Salieri

Journal:

Applied Surface Science

Year:

1993

Language:

english

File:

PDF, 591 KB

english, 1993